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[HOT SHARE] VLSI Design and Test, 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings Books

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[Paid Ebooks] Price: 65.51 EUR (Free). Download VLSI Design and Test, 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings.

This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.

Additional Information:

Title: VLSI Design and Test, 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings
Author: Manoj Singh Gaur,Mark Zwolinski,Vijay Laxmi,D. Boolchandani,Virendra Sing,Adit Singh
Item ID: 6_-5BQAAQBAJ
Publisher: Springer
Type: BOOK
Format File: PDF & EPUB
Android/iOS: Install “Google Play Books”
Page Count: 388
Category: Computers
Published Date: 2013-12-13
Language: en
Isbn 10: 3642420249
Isbn 13: 9783642420245
Sale Info: FOR_SALE
Price: 65.51 EUR


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